Your software supports the use of various microscopes. Not all of these microscopes can use your software's full functionality. This could be because the microscope is limited in its ability to be remotely controlled, for example.
See also
Tool Window - Microscope Control
The FEI/Philips CM series
Your software supports the use of FEI/Philips CM series microscopes. If you are using a CM series microscope, the microscope can be controlled by your software. However, the functionality that is possible over remote control is limited.
Prerequisite: You selected a CM series microscope when installing the software and have configured it.
Structure of the tool window for CM series microscopes
In the Microscope Control tool window, the available functions are limited. You can read out some microscope settings and control certain microscope components by remote control.
(2) Selecting the observation method
(3) Controlling the microscope units
(4) Viewing the microscope settings
(1) Toolbar
Beam Blanker
Click the Beam Blanker button to switch the Beam Blanker on or off.
Note: The beam blanker's current status is displayed in the Microscope Info group.
When the beam blanker is switched off, it has the Opened status. The electron beam will not be deflected anymore. The sample is fully illuminated and you can observe it.
When the beam blanker is switched off, it has the Closed status. The electron beam will be deflected and/or a shutter is closed. The sample as well as the camera will now not be illuminated anymore.
(2) Selecting the observation method
What is an observation method?
An observation method comprises all microscope units that can be controlled by your software and the definition of their state. This means that the microscope can be set up for a particular task with one click.
Automatic observation method at image acquisition
When you switch to the live-image or acquire an image, your system automatically switches to the Camera Mode observation method.
•When you're working with a side-mounted camera, the camera will be retracted from the microscope column and the beam blanker is turned off.
•When you are working with a camera that is mounted below the microscope column, the beam blanker is switched off.
In the Camera Mode observation method, you can read out the fluorescent screen's status but you can't control it with the software. You have to manually raise the fluorescent screen so that the camera that is mounted below the microscope column can be illuminated and you can see an image in your software.
Manual observation method, when you are working without a camera
If you don't need your camera, because you prefer to focus using the microscope's eyepiece for example, you can use the Manual observation method.
To do this, click the Manual button. The Manual button appears clicked. You can recognize this status by the button's colored background.
•When you're working with a side-mounted camera, the camera is retracted from the microscope column and the beam blanker is turned off if necessary.
•When you are working with a camera that is mounted below the microscope column, the fluorescent screen on your transmission electron microscope is not automatically lowered. A message box appears telling you that the fluorescent screen has to be manually lowered.
Note: When acquiring dark current correction images during the Shading Correction calibration process, make sure to lower the fluorescent screen manually so that no light enters the camera.
(3) Controlling the microscope units
Selecting the imaging or diffraction mode
Select the microscope's imaging mode by clicking the Imaging or Diffraction button.
In the Imaging imaging mode, you can read the magnification currently set on the transmission electron microscope in the Microscope Info group. Because of the limitations of the remote control, however, the magnification cannot be changed with the software.
In the Diffraction imaging mode, the transmission electron microscope is controlled in a way that enables the display of the diffraction image. You can read out but not change the transmission electron microscope's currently set camera length with the software. The current camera length can be found in the Microscope Info group.
Note: The high intensity of the electron beam can harm the camera.
After image acquisition, switch to Imaging mode immediately or use the beam blanker to avoid any damage to the camera.
(4) Viewing the microscope settings
In the Microscope Info field, you can find the current microscope configuration. Here you can find all microscope units whose status can be read remotely.
•Magnification
•High Voltage
•Stage coordinates
•Stage Tilt (if it is supported by the sample holder)
•Beam Blanker
•Fluorescent Screen
All information in the Microscope Info field is recorded as additional information along with the image itself during image acquisition. You can view the microscope information in the Properties tool window.
Note: Most of the data will only be saved along with your image when you use the TIF or VSI file format.
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